Aberration Corrected TEM at the INA: new capabilities and first results
Congreso:
Transmission Electron Microscopy, Advanced Applications for Materials Science and Nanotechnology
Tipo de participación:
Póster
Otros autores:
C. Magén
Año :
2010
Lugar:
Bellaterra, Barcelona, Spain
Publicación (cita):
C. Magén. Aberration Corrected TEM at the INA: new capabilities and first results . En: Transmission Electron Microscopy, Advanced Applications for Materials Science and Nanotechnology. Bellaterra, Barcelona, Spain: , 2010