Atomic-scale imaging of a complex point defect: O-decorated Cu vacancies in YBa2Cu3O7-x
Congress:
16th European Microscopy Congress (EMC´16), August 28-Sept. 2, 2016 Lyon (France)
Participation type:
Comunicación oral
Other authors:
J. Gazquez, R. Guzman, R. Mishra, E. Bartolomé, J. Salafranca, C. Magén, M. Varela, M. Coll, A. Palau, S. M. Valvidares, P. Gargiani, E. Pellegrin, J. Herrero-Martin, S. J. Pennycook, S.T. Pantelides, T. Puig, X. Obradors
Year:
2016
Location:
Lyon, France